Elsayed A. Elsayed is Distinguished Professor and Chairman of the Department of Industrial and Systems Engineering, Rutgers University. He is also the Director of the NSF/ Industry/ University Co-operative Research Center for Quality and Reliability Engineering. His research interests are in the areas of quality and reliability engineering and Production Planning and Control. He is a co-author of Quality Engineering in Production Systems, McGraw Hill Book Company, 1989. He is also the author of Reliability Engineering, Addison-Wesley, 1996. These two books received the 1990 and 1997 IIE Joint Publishers Book-of-the-Year Award respectively. His recent book Reliability Engineering 2nd Edition, Wiley, 2012 received the 2013 Outstanding IIE Publication.
Dr. Elsayed is also a co-author of Analysis and Control of Production Systems, Prentice-Hall, 2nd Edition, 1994. His research has been funded by the DoD, FAA, NSF and industry. Dr. Elsayed has been a consultant for AT&T Bell Laboratories, Ingersoll-Rand, Johnson & Johnson, Personal Products, AT&T Communications, BellCore and other companies. He served as the Editor-in-Chief of the IIE Transactions and the Editor of the IIE Transactions on Quality and Reliability Engineering. He is Editor-in-Chief of Quality Technology and Quality Management. Dr. Elsayed is also the Editor of the International Journal of Reliability, Quality and Safety Engineering. He serves on the editorial boards of eight journals in different capacities. He served an external evaluator for many undergraduate and graduate programs.
Dr. Elsayed is a frequent keynote speakers in National and International Conferences and is the recipient of many awards including Golomski Award for the outstanding paper, William Mong Distinguished Lecturers Award, David F. Baker Research Award of the Institute of Industrial Engineers for Research Contributions to the discipline of Industrial Engineering, inducted member of the Russian Academy for Quality, IIE (Institute of Industrial Engineers) Fellow Award, ASME Fellow, Senior Fulbright Award and the Recipient of 2011 Thomas Alva Edison Award for US Patent 7,115,089 B2.
Dr. Elsayed has been involved in reliability accelerated life testing since 1987 when he developed a reliability prediction model for the first transatlantic fiber optics cable during his sabbatical at Bell Laboratories. Since then he developed a general accelerated statistics-physics based model to predict reliability at normal operating conditions. During the last 15 years he has been extending his work to the degradation modeling area and design of accelerated life testing plans. He has verified his models by conducting extensive accelerated life testing on variety of products using the quality and reliability engineering laboratory at Rutgers. He worked with his students on the design of self-diagnostic dishwasher and analysis of failure and degradation data of washing machines and vending machines. The work involved the placement of sensors at critical components (use criticality measures) and continuously monitor and analyze the degradation data. The data are then retrieved into a degradation model that determines the mean residual life and criticality of components.
